Jennifer Dworak joined the Bobby B. Lyle School of Engineering, Department of Computer Science and Engineering as a new faculty member in July of this year. Her research interest and expertise focus on ensuring the correct operation of integrated circuits and systems through advances in manufacturing test and online error detection. Dr. Dworak’s research is supported by two grants from the National Science Foundation, including an NSF CAREER Award. Her CAREER project aims to enhance the lifetime reliability of multi-core systems through the intelligent generation of test sets that are dynamically targeted toward the areas of greatest need. It will take advantage of the expected dramatic growth in the number of cores per chip and will harness information from on-chip hardware monitors to create superior test sets that are optimized for each individual’s user environment. The chosen tests will then be efficiently transported through the chip’s network-on-chip communication infrastructure for application in the field.
Dr. Dworak earned her PhD at Texas A&M University in 2004 and joined Brown University as an assistant professor in 2005. She is the recipient of multiple awards for research, including a Best Paper Award at the 1999 VLSI Test Symposium, an Ethel Ashworth-Tsutsui Memorial Award, and the 2004 TTTC Naveena Nagi Award, among others. She was also chair of the 2008 CADathlon programming competition and general chair of the 2009 International Test Synthesis Workshop. She is currently program chair for the 2011 North Atlantic Test Workshop and test track chair for the 2010 International Conference on Computer Aided Design.