Scanning Electron Microscope

The SEM lab contains a Leo 1450 variable pressure electron microscope acquired in 2003 with a NSF grant that supports several departments here at SMU. The instrument has both low and high vacuum secondary electron detectors as well as a solid state backscatter electron detector. It is also equipped with an Edax energy dispersive X-ray analysis system for determining elemental composition of sample materials. A Gatan Chroma CL cathodoluminescent system was added recently to image samples emitting multiple wavelengths of light under electron beam bombardment. The laboratory is also equipped with sample preparation facilities that include a Denton Vacuum DCP-1 Critical Point Dryer and a Desk II Plasma Coater with Au/Pd target.