- SEM, XRD, XRF Lab Tech
- Department Electronics Support
Roy joined the department in December of 1998 following more than 19 years with Texas Instruments. Trained in Electronic Engineering Technology, he developed a broad range of skills while working in the Central Research Laboratories of T.I. including 12 years in the Secondary Ion Mass Spectroscopy (SIMS) Lab of the Materials Characterization Group. Roy enjoys computer animation, multimedia/graphic design.
Roy supports day to day operations of the SEM, X-ray Diffraction, X-ray Fluorescence labs as well as providing electronic maintenance support for other labs within the department.