Jeong Ho You
Department of Mechanical Engineering
Ph.D. University of Illinois at Urbana & Champaign, 2007; M.S. University of Texas at Austin, 2002; B.Eng. ChungAng University, Seoul, Korea, 1999
Computational nanomechanics, photovoltaics, nanoelectronic and optoelectronic systems, ferroelectric/piezoelectric energy conversion systems, atomic scale simulations
Research Accomplishments and Activities
Outstanding paper award from Noise Control Engineering Journal, Postdoctoral scholar at California Institute of Technology, Peer reviewer in the Archive of Applied Mechanics, Summer fellowship from University of Texas-Austin, Scholarships from ChungAng University, Member of ASME, MRS, APS, and ASA
In electronic materials, the mechanical properties play an important role to determine the characteristics, efficiency, and lifetime of systems. For an example, semiconductor hetero-structures often contain the misfit strain and defects induced by the lattice mismatch. Chemical disorders in ferroelectric/mutiferroic compounds also induce localized strain fields which are important factors in system performance. To study the mechanical effects in electronic systems, the interdisciplinary studies are required covering the broad areas in mechanics, materials science, physics, chemistry, etc. My research focuses on coupling continuum solid mechanics, atomic scale mechanics, and quantum mechanics in areas of optoelectronics, photovoltaics, ferroelectrics, and multiferroics. My work consists of computational and analytical modeling for chemical disorders, defects, mechanical strain, and energy conversions.
- Jeong Ho You and H. T. Johnson, “Effect of dislocations on electrical and optical properties in GaAs and GaN,” Solid State Physics 61, 143 (2009). [invited, review article]
- Jeong Ho You and H. T. Johnson, “Effects of threading edge dislocations on the photoluminescence spectrum in n-type Wurtzite GaN,” Phys. Rev. B, 76, 115336 (2007).
- Jeong Ho You and H. T. Johnson, “Effect of screw dislocation density on optical properties in n-type wurtzite GaN,” J. Appl. Phys. 101, 023516 (2007).
- Jeong Ho You, Jun-Qiang Lu, and H. T. Johnson, “Electron scattering due to threading edge dislocations in n-type wurtzite GaN,” J. Appl. Phys. 99, 033706 (2006).
- Penelope Menounou and Jeong Ho You, “Design of a jagged-edge barrier: numerical and experimental study,” Noise Control Engineering Journal 52(5), 210-224 (2005): awarded, INCE outstanding paper.